지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.13 No.5
- 발행연도
- 2013.10
- 수록면
- 451 - 458 (8page)
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초록· 키워드
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This paper describes a design of LIN MCU using efficient memory accessing architecture which provides concurrent data and address fetch for faster communication. By using slew rate control it can reduce EMI emission while satisfying required communication specifications. To verify the efficiency of the LIN MCU, we developed a SoC and tested for several data packets. Measurements show that this LIN MCU improves network efficiency up to 17.19 % and response time up to 31.26 % for nominal cases. EMI radiation also can be reduced up to 10 dB.
목차
Abstract
I. INTRODUCTION
II. EFFICIENT LIN MCU DESIGN
III. MEASUREMENT RESULTS
IV. CONCLUSIONS
REFERENCES
참고문헌 (14)
참고문헌 신청
1. [학술대회논문] - N. Navet / 2005 / Trend in automotive communication systems / Proc. IEEE Spec. Issue Ind. Commun. Syst. 9. : 1024 ~ 1223
2. [학술지(정기간행물)] - A. Shrinath / 2004 / Electronic control units for automotive electrical power systems: communication and networks / Proc. IMechE D: J. Automob. Eng 218 : 1217 ~ 1230
3. [학술대회논문] - U. Abelein / 2012 / Complexity, quality and robustness - the challenges of tomorrow's automotive electronics / Design, Automation & Test in Europe Conference (DATE) : 870 ~ 871
4. [인터넷자원] - LIN Consortium / / LIN specification package revision 2.2
5. [학술지(정기간행물)] - J.-M. Redoute / 2007 / An EMI resisting LIN Driver in 0.35-micron high–voltage CMOS / IEEE Journal of Solid-State Circuits 42 (7) : 1574 ~ 1582
2. [학술지(정기간행물)] - A. Shrinath / 2004 / Electronic control units for automotive electrical power systems: communication and networks / Proc. IMechE D: J. Automob. Eng 218 : 1217 ~ 1230
3. [학술대회논문] - U. Abelein / 2012 / Complexity, quality and robustness - the challenges of tomorrow's automotive electronics / Design, Automation & Test in Europe Conference (DATE) : 870 ~ 871
4. [인터넷자원] - LIN Consortium / / LIN specification package revision 2.2
5. [학술지(정기간행물)] - J.-M. Redoute / 2007 / An EMI resisting LIN Driver in 0.35-micron high–voltage CMOS / IEEE Journal of Solid-State Circuits 42 (7) : 1574 ~ 1582
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UCI(KEPA) : I410-ECN-0101-2014-560-002740934