지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.13 No.2
- 발행연도
- 2013.4
- 수록면
- 139 - 144 (6page)
이용수
초록· 키워드
오류제보하기
Negative bias temperature instability (NBTI) has become a major factor determining circuit reliability. The effect of the NBTI on the circuit performance depends on the duty cycle which represents the stress and recovery conditions of each device in a circuit. In this paper, we propose an analytical model to perform more accurate duty cycle estimation at the gate-level. The proposed model allows accurate (average error rate: 3%) computation of the duty cycle without the need for expensive transistor-level simulations Furthermore, our model estimates the waveforms at each node, allowing various aging effects to be applied for a reliable gatelevel circuit aging analysis framework.
목차
Abstract
I. INTRODUCTION
II. STRESS ESTIMATION AT THE GATE- LEVEL
III. EXPERIMENTAL RESULTS
IV. CONCLUSIONS
REFERENCES
참고문헌 (5)
참고문헌 신청
1. [학술지(정기간행물)] - S. Bhardwaj / 2008 / Scalable model for predicting the effect of negative bias temperature instability for reliable design / IET Circuits Devices Syst 2 (4) : 361 ~ 371
2. [학술지(정기간행물)] - Park, S. P. / 2009 / Reliability Implications of Bias-Temperature Instability in Digital ICs / Design & Test of Computers, IEEE 26 (6) : 8 ~ 17
3. [학술대회논문] - Velamala, J. B. / 2011 / Failure diagnosis of asymmetric aging under NBTI / Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on : 428 ~ 433
4. [학술대회논문] - Xakellis, M.G. / 1994 / Statistical Estimation of the Switching Activity in Digital Circuits / Design Automation, 1994. 31st Conference on : 728 ~ 733
5. [인터넷자원] - / / Nangate FreePDK45 Generic Open Cell Library
2. [학술지(정기간행물)] - Park, S. P. / 2009 / Reliability Implications of Bias-Temperature Instability in Digital ICs / Design & Test of Computers, IEEE 26 (6) : 8 ~ 17
3. [학술대회논문] - Velamala, J. B. / 2011 / Failure diagnosis of asymmetric aging under NBTI / Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on : 428 ~ 433
4. [학술대회논문] - Xakellis, M.G. / 1994 / Statistical Estimation of the Switching Activity in Digital Circuits / Design Automation, 1994. 31st Conference on : 728 ~ 733
5. [인터넷자원] - / / Nangate FreePDK45 Generic Open Cell Library
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