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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.12 No.3
- 발행연도
- 2012.9
- 수록면
- 286 - 292 (7page)
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초록· 키워드
오류제보하기
Scan techniques are almost mandatorily adopted in designing current System-on-a-Chip (SoC) to enhance testability, but inadvertently secret keys can be stolen through the scan test channels of crypto SoCs. An efficient scan design technique is proposed in this paper to protect the secret key of an Advanced Encryption Standard (AES) core embedded in an SoC. A new instruction is added to IEEE 1149.1 boundary scan to use a fake key instead of user key, in which the fake key is chosen with meticulous care to improve the testability as well. Our approach can be implemented as user defined logic with conventional boundary scan design, hence no modification is necessary to any crypto IP core. Conformance to the IEEE 1149.1 standards is completely preserved while yielding better performance of area, power, and fault coverage with highly robust protection of the secret user key.
목차
Abstract
Ⅰ. INTRODUCTION
Ⅱ. PREVIOUS SCAN DESIGN TECHNIQUES TO PROTECT AES SECRET USER KEY
Ⅲ. PROPOSED SECURED SCAN DESIGN
Ⅳ. EXPERIMENTAL RESULTS
Ⅴ. CONCLUSIONS
ACKNOWLEDGMENTS
REFERENCES
참고문헌 (17)
참고문헌 신청
1. [학술지(정기간행물)] - Mangard, M. Aigner / 2004 / A Highly Regular and Scalable AES Hardware Architecture / IEEE Transactions on Computer 52 (1) : 483 ~ 491
2. [학술지(정기간행물)] - Chanho Lee / 2011 / Smart Bus Arbiter for QoS control in H.264 decoders / JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 11 (1) : 33 ~ 39
3. [학술대회논문] - Josephson / 2001 / Debug methodology for the McKinley processor / International Test Conference(ITC) : 451 ~ 460
4. [학술지(정기간행물)] - J. Lee / 2007 / Securing Designs Against Scan-Based Side-Channel Attacks / IEEE Transations on Depedableand Secure Computing 4 (4) : 325 ~ 336
5. [단행본] - M. L. Bushnell / 2000 / Essentials of Electronic Testing / Kluwer Academic Publishers
2. [학술지(정기간행물)] - Chanho Lee / 2011 / Smart Bus Arbiter for QoS control in H.264 decoders / JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 11 (1) : 33 ~ 39
3. [학술대회논문] - Josephson / 2001 / Debug methodology for the McKinley processor / International Test Conference(ITC) : 451 ~ 460
4. [학술지(정기간행물)] - J. Lee / 2007 / Securing Designs Against Scan-Based Side-Channel Attacks / IEEE Transations on Depedableand Secure Computing 4 (4) : 325 ~ 336
5. [단행본] - M. L. Bushnell / 2000 / Essentials of Electronic Testing / Kluwer Academic Publishers
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