메뉴 건너뛰기
.. 내서재 .. 알림
소속 기관/학교 인증
인증하면 논문, 학술자료 등을  무료로 열람할 수 있어요.
한국대학교, 누리자동차, 시립도서관 등 나의 기관을 확인해보세요
(국내 대학 90% 이상 구독 중)
로그인 회원가입 고객센터 ENG
주제분류

추천
검색
질문

논문 기본 정보

자료유형
학술대회자료
저자정보
Tetsuya Iizuka (University of Tokyo) Daisuke Nakamura (University of Tokyo) Hiroaki Yoshida (University of Tokyo) Satoshi Komatsu (University of Tokyo) Masahiro Sasaki (University of Tokyo) Makoto Ikeda (University of Tokyo) Kunihiro Asada (University of Tokyo)
저널정보
대한전자공학회 대한전자공학회 ISOCC ISOCC 2009 Conference
발행연도
2009.11
수록면
208 - 211 (4page)

이용수

표지
📌
연구주제
📖
연구배경
🔬
연구방법
🏆
연구결과
AI에게 요청하기
추천
검색
질문

초록· 키워드

오류제보하기
As the VLSI technologies scale down to the nanometer regime, the circuit design and verification processes have become more and more complex and a reliable operation of VLSI becomes sensitive to the PVT (Process, Voltage, and Temperature) variations. Therefore, the LSI test only before the shipment to screen out the initial failures has been insufficient to ensure the reliable in-field operation of LSI.
In this paper, we propose an SoC platform with on-chip web interface to realize an in-field LSI testing and an easy access to the on-chip LSI monitoring circuits such as scan registers, temperature sensors, and so on. We can control the on-chip monitoring systems through the web interface, and can monitor the LSI correct operations from remote locations using the proposed platform. Therefore, the proposed SoC platform realizes the LSI functionality monitoring even after the shipment and can test the in-field operation of LSI. This platform consists of 16-bit CPU, 64K words of instruction/data memory, and 10Base-T ethernet interface. A preliminary version of the proposed platform was implemented on 0.18μm standard CMOS process. The area overhead is 8.44mm2 on 0.18μm process, and is estimated to scale down to about 1mm<SUB>2</SUB> on 65nm process.

목차

Abstract
I. INTRODUCTION
II. CONCEPT OF THE PROPOSED PLATFORM
III. ARCHITECTURE OF THE PROPOSED PLATFORM
IV. EXPERIMENTAL RESULTS
V. CONCLUSIONS
ACKNOWLEDGMENTS
REFERENCES

참고문헌 (0)

참고문헌 신청

함께 읽어보면 좋을 논문

논문 유사도에 따라 DBpia 가 추천하는 논문입니다. 함께 보면 좋을 연관 논문을 확인해보세요!

이 논문의 저자 정보

최근 본 자료

전체보기

댓글(0)

0

UCI(KEPA) : I410-ECN-0101-2013-569-001482625