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학술대회자료
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대한전기학회 대한전기학회 학술대회 논문집 2008 대한전기학회 전기설비전문위원회 추계학술대회 논문집
발행연도
2008.9
수록면
207 - 210 (4page)

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In this paper, we researched the dielectric properties and voltage dependence on slice XLPE sheet from 22[㎸] and 154[㎸] power cable. We studied effects for impurities and water for semiconductor shield through a dielectric properties experiment to estimate performance of insulating materials in power cable. Capacitance and tanδ of 22[㎸], 154[㎸] were 53/43[pF] and 7.4×10?⁴, 2.1510?⁴. In these results, the trend was increased with the increase of temperature. The tanδ of XLPE/ semiconductor layer was increased as compared with that of XLPE. Dielectric properties reliability of tanδ was small. Also, To improve mean-life and reliability of power cable in this study, we have investigated chemical properties showing by changing the content of carbon black that is semiconductive additives for underground power transmission. Specimens were made of sheet form with the three of existing resins and the nine of specimens for measurement. Chemical properties of specimens was measured by FT-ATR (Fourier Transform Attenuated Total Reflectance). The condition of specimens was a solid sheet. We could observe functional group (C=O, carbonyl group) of specimens through FT-ATR. From these experimental result, the concentration of functional group (C=O) was high according to increasing the content of carbon black. We could know EEA was excellent more than other specimens from above experimental results.

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