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학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
초록· 키워드
오류제보하기
An X-ray diffractometer for spatially resolved X-ray diffraction measurements was developed to identify phase in the narrow (micron-scaled) region of high burn-up fuels and some nuclear materials. The micro-XRD was composed of an X-ray microbeam alignment system and a sample micro translation system instead of a normal slit and a fixed sample stage in a commercial XRD. The X-ray microbeam alignment system was fabricated with a microbeam concentrator having two Ni deposited mirrors, a vertical positioner, and a tilt table for the generation of a concentrated microbeam. The sample micro translation system was made with a sample holder and a horizontal translator, allowing movement of a specimen at 5 ㎛ steps. The angular intensity profile of the microbeam generated through a concentrator was symmetric and not distorted. The size of the microbeam was 4,000×20 ㎛ and the spatial resolution of the beam was 47 ㎛ at the sample position. When the diffraction peaks were measured for a UO₂ pellet specimen by this system, the reproducibility (2θ = ± 0.01°) of the peaks was as good as a conventional X-ray diffractometer. For the cross section of oxidized titanium metal, not only TiO₂ in an outer layer but also TiO near an oxide-metal interface was observed.
목차
Abstract
1. Introduction
2. Development of a micro X-ray diffractometer
3. Evaluation of a developed micro X-ray diffractometer
4. Conclusion
Acknowledgments
REFERENCES
참고문헌 (14)
참고문헌 신청
J. Spino and D. Papaioannou, Journal of Nuclear Materials, 281, 146-162 (2000).
D. Papaioannou and J. Spino, Review of Scientific Instruments, 73, 2659-2665 (2002).
D. H. Bilderback and D. J. Thiel, Review of Scientific Instruments, 66, 2059-2063 (1995).
Y. Suzuki and F. Uchida, Review of Scientific Instruments, 63, 578-581 (1992).
M. R. Howells, D. Cambie, R.M. Duarte, S. Irick, A.A. MacDowell, Opt. Eng. 39, 2748-2762 (2000).
D. Papaioannou and J. Spino, Review of Scientific Instruments, 73, 2659-2665 (2002).
D. H. Bilderback and D. J. Thiel, Review of Scientific Instruments, 66, 2059-2063 (1995).
Y. Suzuki and F. Uchida, Review of Scientific Instruments, 63, 578-581 (1992).
M. R. Howells, D. Cambie, R.M. Duarte, S. Irick, A.A. MacDowell, Opt. Eng. 39, 2748-2762 (2000).
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