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논문 기본 정보
- 자료유형
- 학술대회자료
- 저자정보
- 발행연도
- 1991.7
- 수록면
- 34 - 38 (5page)
이용수
초록· 키워드
오류제보하기
The recent development of the scanning probe microscopes with their unique capability of direct imaging surface structures, with atomic resolution to 100Å, promises to revolutionize the conceptual understanding and experimental techniques in fundamental and applied surface science. The technical development and results obtained with various scanning probe microscopies, since the inception of scanning tunneling microscope 10 years ago, are briefly reviewed.
목차
Abstract
Ⅰ. Introduction
Ⅱ. Recent Development
Ⅲ. Summary of Application
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